Metal-induced lateral crystallization of germanium thin films

Recent advances in polycrystalline Ge layers formed through solid-phase crystallization have demonstrated carrier mobilities superior to those of single-crystal Si. In this study, we thoroughly examined the phenomenon of metal-induced lateral crystallization in Ge, a topic that had garnered signific...

Full description

Bibliographic Details
Main Authors: Takamitsu Ishiyama, Kota Igura, Takashi Suemasu, Kaoru Toko
Format: Article
Language:English
Published: Elsevier 2023-08-01
Series:Materials & Design
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S0264127523005312