The importance of the image forces and dielectric environment in modeling contacts to two-dimensional materials

Abstract The performance of transistors based on two-dimensional (2D) materials is affected largely by the contact resistance due to high Schottky barriers at the metal-2D-material interface. In this work, we incorporate the effect of surrounding dielectrics and image-force barrier-lowering in calcu...

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Bibliographic Details
Main Authors: Madhuchhanda Brahma, Maarten L. Van de Put, Edward Chen, Massimo V. Fischetti, William G. Vandenberghe
Format: Article
Language:English
Published: Nature Portfolio 2023-03-01
Series:npj 2D Materials and Applications
Online Access:https://doi.org/10.1038/s41699-023-00372-6