Test and study on sensitivity of electronic circuit in low‐voltage release to voltage sags
This study focuses on sensitivity of electronic circuit in low‐voltage release to voltage sags based on a large‐scale test results. Although studies about ride‐through capability of some electronic devices during voltage sags have been carried out, there is few research available on sensitivity of e...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi-IET
2017-11-01
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| Series: | IET Circuits, Devices and Systems |
| Subjects: | |
| Online Access: | https://doi.org/10.1049/iet-cds.2016.0222 |