FPGA-Based Reliable Fault Secure Design for Protection against Single and Multiple Soft Errors

FPGA-Based Reliable Fault Secure Design for Protection against Single and Multiple Soft Errors

Field programmable gate arrays (FPGAs) are increasingly used in industry (e.g., biomedical, space, and automotive industries). FPGAs are subjected to single, as well as multiple event upsets (SEUs and MEUs), due to the continuous shrinking of transistor dimensions. These upsets inevitably decrease s...

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Bibliographic Details
Main Authors: Manar N. Shaker, Ahmed Hussien, Gehad I. Alkady, Hassanein H. Amer, Ihab Adly
Format: Article
Language:English
Published: MDPI AG 2020-12-01
Series:Electronics
Subjects:
FPGA
single event upset (SEU)
multiple event upsets (MEUs)
automotive
fault tolerance
fault secure
Online Access:https://www.mdpi.com/2079-9292/9/12/2064

Internet

https://www.mdpi.com/2079-9292/9/12/2064

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