Franck Condon analysis of emission and excitation spectra of fused silica materials
Analysis of defects in optical materials is essential for their applicability in cutting-edge optical components. Since fused silica (FS) counts among the most used materials, deep knowledge about the defects in FS is of high importance. These defects have been routinely identified by studying photo...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2023-01-01
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| Series: | EPJ Web of Conferences |
| Online Access: | https://www.epj-conferences.org/articles/epjconf/pdf/2023/13/epjconf_eosam2023_05025.pdf |