Hardness assurance levels and requirements for single event effects testing of integrated circuits

Hardness assurance levels and requirements for single event effects testing of integrated circuits

The paper presents an analysis of existing approaches to estimation of single event rate (SER) in integrated circuits under effects of charged particles of space radiation environment. These issues are of significant importance in the light of the expansion of the scope of practical application of c...

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Bibliographic Details
Main Authors: Alexander I. Chumakov, Armen V. Sogoyan, Anatoly A. Smolin, Alexey O. Ahmetov, Dmitry V. Bobrovsky, Dmitry V. Boychenko, Nikolai V. Ryasnoy, Konstantin A. Chumakov, Evgeny V. Churilin, Vladimir F. Gerasimov, Vitaly V. Khaustov, Alexander A. Sashov, Anastasia V. Ulanova, Andrey V. Yanenko
Format: Article
Language:English
Published: Joint Stock Company "Experimental Scientific and Production Association SPELS 2020-03-01
Series:Безопасность информационных технологий
Subjects:
single event effects, hardness assurance levels, test requirements.
Online Access:https://bit.mephi.ru/index.php/bit/article/view/1254

Internet

https://bit.mephi.ru/index.php/bit/article/view/1254

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