Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes

Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes

We report on the degradation mechanisms and dynamics of silicone encapsulated ultraviolet A (UV-A) high-power light-emitting diodes (LEDs), with a peak wavelength of <inline-formula> <tex-math notation="LaTeX">${\mathrm {365~ \text {n} \text {m} }}$ </tex-math></inline...

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Bibliographic Details
Main Authors: Alexander Herzog, Simon Benkner, Babak Zandi, Matteo Buffolo, Willem D. Van Driel, Matteo Meneghini, Tran Quoc Khanh
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Subjects:
Light-emitting diode (LED)
degradation
UV-A
lifetime prediction
reliability
lens cracking
Online Access:https://ieeexplore.ieee.org/document/10054008/

Internet

https://ieeexplore.ieee.org/document/10054008/

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