Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique

In this paper, a feature termed as the postpeak value is proposed for the pulsed eddy current technique (PECT). Moreover, a method using the postpeak value is proposed to classify surface and reverse defects. A PECT system is built for verification purposes. Experiment results prove that the postpea...

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Bibliographic Details
Main Authors: Jiuhao Ge, Chenkai Yang, Ping Wang, Yongsheng Shi
Format: Article
Language:English
Published: MDPI AG 2020-06-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/20/12/3390