Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique
In this paper, a feature termed as the postpeak value is proposed for the pulsed eddy current technique (PECT). Moreover, a method using the postpeak value is proposed to classify surface and reverse defects. A PECT system is built for verification purposes. Experiment results prove that the postpea...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2020-06-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/20/12/3390 |
| _version_ | 1797565247735726080 |
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| author | Jiuhao Ge Chenkai Yang Ping Wang Yongsheng Shi |
| author_facet | Jiuhao Ge Chenkai Yang Ping Wang Yongsheng Shi |
| author_sort | Jiuhao Ge |
| collection | DOAJ |
| description | In this paper, a feature termed as the postpeak value is proposed for the pulsed eddy current technique (PECT). Moreover, a method using the postpeak value is proposed to classify surface and reverse defects. A PECT system is built for verification purposes. Experiment results prove that the postpeak feature value has better performance than that of the traditional peak value in the case of reverse defect detection. In contrast, the peak value is better than the postpeak value in the case of surface defect detection. Experiment results also validate that the proposed classification algorithm has advantages: classification can be achieved in real time, the calculation process and results are easy to understand, and supervised training is unnecessary. |
| first_indexed | 2024-03-10T19:09:26Z |
| format | Article |
| id | doaj.art-abb46efd829b4b049040355080eb9428 |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-03-10T19:09:26Z |
| publishDate | 2020-06-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-abb46efd829b4b049040355080eb94282023-11-20T03:56:50ZengMDPI AGSensors1424-82202020-06-012012339010.3390/s20123390Defect Classification Using Postpeak Value for Pulsed Eddy-Current TechniqueJiuhao Ge0Chenkai Yang1Ping Wang2Yongsheng Shi3Nondestructive Detection and Monitoring Technology for High Speed Transportation Facilities, Key Laboratory of Ministry of Industry and Information Technology, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, ChinaNondestructive Detection and Monitoring Technology for High Speed Transportation Facilities, Key Laboratory of Ministry of Industry and Information Technology, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, ChinaNondestructive Detection and Monitoring Technology for High Speed Transportation Facilities, Key Laboratory of Ministry of Industry and Information Technology, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, ChinaNondestructive Detection and Monitoring Technology for High Speed Transportation Facilities, Key Laboratory of Ministry of Industry and Information Technology, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, ChinaIn this paper, a feature termed as the postpeak value is proposed for the pulsed eddy current technique (PECT). Moreover, a method using the postpeak value is proposed to classify surface and reverse defects. A PECT system is built for verification purposes. Experiment results prove that the postpeak feature value has better performance than that of the traditional peak value in the case of reverse defect detection. In contrast, the peak value is better than the postpeak value in the case of surface defect detection. Experiment results also validate that the proposed classification algorithm has advantages: classification can be achieved in real time, the calculation process and results are easy to understand, and supervised training is unnecessary.https://www.mdpi.com/1424-8220/20/12/3390nondestructive testingtime domainabsolute signalTMR sensor |
| spellingShingle | Jiuhao Ge Chenkai Yang Ping Wang Yongsheng Shi Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique Sensors nondestructive testing time domain absolute signal TMR sensor |
| title | Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique |
| title_full | Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique |
| title_fullStr | Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique |
| title_full_unstemmed | Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique |
| title_short | Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique |
| title_sort | defect classification using postpeak value for pulsed eddy current technique |
| topic | nondestructive testing time domain absolute signal TMR sensor |
| url | https://www.mdpi.com/1424-8220/20/12/3390 |
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