Fabrication of CMOS Invertors in Si Thin-Film-Transistors by Laser Doping Using a Chemical Solution Coating

We demonstrated that p- and n-type activation layers can be formed in Si films by laser doping with H<sub>3</sub>PO<sub>4</sub> solution and Al<sub>2</sub>O<sub>3</sub> sol coating. The phosphorus and aluminum concentrations at the laser doped region w...

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Bibliographic Details
Main Authors: Kaname Imokawa, Takayuki Kurashige, Akira Suwa, Daisuke Nakamura, Taizoh Sadoh, Tetsuya Goto, Hiroshi Ikenoue
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8918252/
Description
Summary:We demonstrated that p- and n-type activation layers can be formed in Si films by laser doping with H<sub>3</sub>PO<sub>4</sub> solution and Al<sub>2</sub>O<sub>3</sub> sol coating. The phosphorus and aluminum concentrations at the laser doped region were found to be over 10<sup>19</sup> cm<sup>-3</sup> in Si films. In addition, generations of the activation carriers for n- and p-type layers were confirmed by Hall effects measurement. In this study, the characteristic of CMOS invertors fabricated by laser doping are presented.
ISSN:2168-6734