A Technical Survey on Delay Defects in Nanoscale Digital VLSI Circuits
As technology scales down, digital VLSI circuits are prone to many manufacturing defects. These defects may result in functional and delay-related circuit failures. The number of test escapes grows when technology is downscaled. Small delay defects (SDDs) and hidden delay defects (HDDs) are of criti...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-09-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/12/18/9103 |