Approaches for the measurement of lateral dimensions of graphene oxide flakes using scanning electron microscopy

There is a practical need, especially from the industrial community, to accurately measure the size and shape of graphene oxide (GO) flakes of commercial origin, in a reliable, simple, and unambiguous way. The sample preparation is a decisive step to obtain a homogeneous distribution of flakes on a...

पूर्ण विवरण

ग्रंथसूची विवरण
मुख्य लेखकों: Giovanni Chemello, Konstantinos Despotelis, Keith R Paton, Charles A Clifford, Andrew J Pollard, Jörg Radnik, Vasile-Dan Hodoroaba
स्वरूप: लेख
भाषा:English
प्रकाशित: IOP Publishing 2025-01-01
श्रृंखला:Nano Express
विषय:
ऑनलाइन पहुंच:https://doi.org/10.1088/2632-959X/adae28