A new approach for serial electron diffraction data collection

A new approach for serial electron diffraction data collection

This commentary describes a novel method for serial electron diffraction data collection in electron crystallography, utilizing a scanning transmission electron microscope to rapidly obtain patterns with low radiation dose. This approach, demonstrated with zeolite samples, has the potential to provi...

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Bibliographic Details
Main Author: Brent L. Nannenga
Format: Article
Language:English
Published: International Union of Crystallography 2024-01-01
Series:IUCrJ
Subjects:
serial electron diffraction
scanning transmission electron microscopy
structure determination
nanocrystallography
beam-sensitive materials
zeolites
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252523010953

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http://scripts.iucr.org/cgi-bin/paper?S2052252523010953

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