A new approach for serial electron diffraction data collection

This commentary describes a novel method for serial electron diffraction data collection in electron crystallography, utilizing a scanning transmission electron microscope to rapidly obtain patterns with low radiation dose. This approach, demonstrated with zeolite samples, has the potential to provi...

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Main Author: Brent L. Nannenga
Format: Article
Language:English
Published: International Union of Crystallography 2024-01-01
Series:IUCrJ
Subjects:
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252523010953
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author Brent L. Nannenga
author_facet Brent L. Nannenga
author_sort Brent L. Nannenga
collection DOAJ
description This commentary describes a novel method for serial electron diffraction data collection in electron crystallography, utilizing a scanning transmission electron microscope to rapidly obtain patterns with low radiation dose. This approach, demonstrated with zeolite samples, has the potential to provide highly automated and rapid structures from nanocrystalline materials.
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spelling doaj.art-ad244f2f430f4aa3b221e773755b825f2024-01-09T14:58:15ZengInternational Union of CrystallographyIUCrJ2052-25252024-01-011117810.1107/S2052252523010953me6261A new approach for serial electron diffraction data collectionBrent L. Nannenga0Chemical Engineering, School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ 85287, USAThis commentary describes a novel method for serial electron diffraction data collection in electron crystallography, utilizing a scanning transmission electron microscope to rapidly obtain patterns with low radiation dose. This approach, demonstrated with zeolite samples, has the potential to provide highly automated and rapid structures from nanocrystalline materials.http://scripts.iucr.org/cgi-bin/paper?S2052252523010953serial electron diffractionscanning transmission electron microscopystructure determinationnanocrystallographybeam-sensitive materialszeolites
spellingShingle Brent L. Nannenga
A new approach for serial electron diffraction data collection
IUCrJ
serial electron diffraction
scanning transmission electron microscopy
structure determination
nanocrystallography
beam-sensitive materials
zeolites
title A new approach for serial electron diffraction data collection
title_full A new approach for serial electron diffraction data collection
title_fullStr A new approach for serial electron diffraction data collection
title_full_unstemmed A new approach for serial electron diffraction data collection
title_short A new approach for serial electron diffraction data collection
title_sort new approach for serial electron diffraction data collection
topic serial electron diffraction
scanning transmission electron microscopy
structure determination
nanocrystallography
beam-sensitive materials
zeolites
url http://scripts.iucr.org/cgi-bin/paper?S2052252523010953
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