Pink-beam serial femtosecond crystallography for accurate structure-factor determination at an X-ray free-electron laser

Pink-beam serial femtosecond crystallography for accurate structure-factor determination at an X-ray free-electron laser

Serial femtosecond crystallography (SFX) at X-ray free-electron lasers (XFELs) enables essentially radiation-damage-free macromolecular structure determination using microcrystals that are too small for synchrotron studies. However, SFX experiments often require large amounts of sample in order to c...

Full description

Bibliographic Details
Main Authors: Karol Nass, Camila Bacellar, Claudio Cirelli, Florian Dworkowski, Yaroslav Gevorkov, Daniel James, Philip J. M. Johnson, Demet Kekilli, Gregor Knopp, Isabelle Martiel, Dmitry Ozerov, Alexandra Tolstikova, Laura Vera, Tobias Weinert, Oleksandr Yefanov, Jörg Standfuss, Sven Reiche, Christopher J. Milne
Format: Article
Language:English
Published: International Union of Crystallography 2021-11-01
Series:IUCrJ
Subjects:
pink beams
serial femtosecond crystallography
de novo protein structure determination
single-wavelength anomalous diffraction
xfels
large bandwidths
data-quality indicators
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252521008046

Internet

http://scripts.iucr.org/cgi-bin/paper?S2052252521008046

Similar Items