Pink-beam serial femtosecond crystallography for accurate structure-factor determination at an X-ray free-electron laser

Serial femtosecond crystallography (SFX) at X-ray free-electron lasers (XFELs) enables essentially radiation-damage-free macromolecular structure determination using microcrystals that are too small for synchrotron studies. However, SFX experiments often require large amounts of sample in order to c...

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Main Authors: Karol Nass, Camila Bacellar, Claudio Cirelli, Florian Dworkowski, Yaroslav Gevorkov, Daniel James, Philip J. M. Johnson, Demet Kekilli, Gregor Knopp, Isabelle Martiel, Dmitry Ozerov, Alexandra Tolstikova, Laura Vera, Tobias Weinert, Oleksandr Yefanov, Jörg Standfuss, Sven Reiche, Christopher J. Milne
Format: Article
Language:English
Published: International Union of Crystallography 2021-11-01
Series:IUCrJ
Subjects:
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252521008046
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author Karol Nass
Camila Bacellar
Claudio Cirelli
Florian Dworkowski
Yaroslav Gevorkov
Daniel James
Philip J. M. Johnson
Demet Kekilli
Gregor Knopp
Isabelle Martiel
Dmitry Ozerov
Alexandra Tolstikova
Laura Vera
Tobias Weinert
Oleksandr Yefanov
Jörg Standfuss
Sven Reiche
Christopher J. Milne
author_facet Karol Nass
Camila Bacellar
Claudio Cirelli
Florian Dworkowski
Yaroslav Gevorkov
Daniel James
Philip J. M. Johnson
Demet Kekilli
Gregor Knopp
Isabelle Martiel
Dmitry Ozerov
Alexandra Tolstikova
Laura Vera
Tobias Weinert
Oleksandr Yefanov
Jörg Standfuss
Sven Reiche
Christopher J. Milne
author_sort Karol Nass
collection DOAJ
description Serial femtosecond crystallography (SFX) at X-ray free-electron lasers (XFELs) enables essentially radiation-damage-free macromolecular structure determination using microcrystals that are too small for synchrotron studies. However, SFX experiments often require large amounts of sample in order to collect highly redundant data where some of the many stochastic errors can be averaged out to determine accurate structure-factor amplitudes. In this work, the capability of the Swiss X-ray free-electron laser (SwissFEL) was used to generate large-bandwidth X-ray pulses [Δλ/λ = 2.2% full width at half-maximum (FWHM)], which were applied in SFX with the aim of improving the partiality of Bragg spots and thus decreasing sample consumption while maintaining the data quality. Sensitive data-quality indicators such as anomalous signal from native thaumatin micro-crystals and de novo phasing results were used to quantify the benefits of using pink X-ray pulses to obtain accurate structure-factor amplitudes. Compared with data measured using the same setup but using X-ray pulses with typical quasi-monochromatic XFEL bandwidth (Δλ/λ = 0.17% FWHM), up to fourfold reduction in the number of indexed diffraction patterns required to obtain similar data quality was achieved. This novel approach, pink-beam SFX, facilitates the yet underutilized de novo structure determination of challenging proteins at XFELs, thereby opening the door to more scientific breakthroughs.
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spelling doaj.art-ad50bebd17b6464fb70fffcb3373aa322022-12-21T23:51:08ZengInternational Union of CrystallographyIUCrJ2052-25252021-11-018690592010.1107/S2052252521008046zf5018Pink-beam serial femtosecond crystallography for accurate structure-factor determination at an X-ray free-electron laserKarol Nass0Camila Bacellar1Claudio Cirelli2Florian Dworkowski3Yaroslav Gevorkov4Daniel James5Philip J. M. Johnson6Demet Kekilli7Gregor Knopp8Isabelle Martiel9Dmitry Ozerov10Alexandra Tolstikova11Laura Vera12Tobias Weinert13Oleksandr Yefanov14Jörg Standfuss15Sven Reiche16Christopher J. Milne17Paul Scherrer Institut, Forschungstrasse 111, Villigen 5232, SwitzerlandPaul Scherrer Institut, Forschungstrasse 111, Villigen 5232, SwitzerlandPaul Scherrer Institut, Forschungstrasse 111, Villigen 5232, SwitzerlandPaul Scherrer Institut, Forschungstrasse 111, Villigen 5232, SwitzerlandCenter for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, Hamburg 22607, GermanyPaul Scherrer Institut, Forschungstrasse 111, Villigen 5232, SwitzerlandPaul Scherrer Institut, Forschungstrasse 111, Villigen 5232, SwitzerlandPaul Scherrer Institut, Forschungstrasse 111, Villigen 5232, SwitzerlandPaul Scherrer Institut, Forschungstrasse 111, Villigen 5232, SwitzerlandPaul Scherrer Institut, Forschungstrasse 111, Villigen 5232, SwitzerlandPaul Scherrer Institut, Forschungstrasse 111, Villigen 5232, SwitzerlandCenter for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, Hamburg 22607, GermanyPaul Scherrer Institut, Forschungstrasse 111, Villigen 5232, SwitzerlandPaul Scherrer Institut, Forschungstrasse 111, Villigen 5232, SwitzerlandCenter for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, Hamburg 22607, GermanyPaul Scherrer Institut, Forschungstrasse 111, Villigen 5232, SwitzerlandPaul Scherrer Institut, Forschungstrasse 111, Villigen 5232, SwitzerlandPaul Scherrer Institut, Forschungstrasse 111, Villigen 5232, SwitzerlandSerial femtosecond crystallography (SFX) at X-ray free-electron lasers (XFELs) enables essentially radiation-damage-free macromolecular structure determination using microcrystals that are too small for synchrotron studies. However, SFX experiments often require large amounts of sample in order to collect highly redundant data where some of the many stochastic errors can be averaged out to determine accurate structure-factor amplitudes. In this work, the capability of the Swiss X-ray free-electron laser (SwissFEL) was used to generate large-bandwidth X-ray pulses [Δλ/λ = 2.2% full width at half-maximum (FWHM)], which were applied in SFX with the aim of improving the partiality of Bragg spots and thus decreasing sample consumption while maintaining the data quality. Sensitive data-quality indicators such as anomalous signal from native thaumatin micro-crystals and de novo phasing results were used to quantify the benefits of using pink X-ray pulses to obtain accurate structure-factor amplitudes. Compared with data measured using the same setup but using X-ray pulses with typical quasi-monochromatic XFEL bandwidth (Δλ/λ = 0.17% FWHM), up to fourfold reduction in the number of indexed diffraction patterns required to obtain similar data quality was achieved. This novel approach, pink-beam SFX, facilitates the yet underutilized de novo structure determination of challenging proteins at XFELs, thereby opening the door to more scientific breakthroughs.http://scripts.iucr.org/cgi-bin/paper?S2052252521008046pink beamsserial femtosecond crystallographyde novo protein structure determinationsingle-wavelength anomalous diffractionxfelslarge bandwidthsdata-quality indicators
spellingShingle Karol Nass
Camila Bacellar
Claudio Cirelli
Florian Dworkowski
Yaroslav Gevorkov
Daniel James
Philip J. M. Johnson
Demet Kekilli
Gregor Knopp
Isabelle Martiel
Dmitry Ozerov
Alexandra Tolstikova
Laura Vera
Tobias Weinert
Oleksandr Yefanov
Jörg Standfuss
Sven Reiche
Christopher J. Milne
Pink-beam serial femtosecond crystallography for accurate structure-factor determination at an X-ray free-electron laser
IUCrJ
pink beams
serial femtosecond crystallography
de novo protein structure determination
single-wavelength anomalous diffraction
xfels
large bandwidths
data-quality indicators
title Pink-beam serial femtosecond crystallography for accurate structure-factor determination at an X-ray free-electron laser
title_full Pink-beam serial femtosecond crystallography for accurate structure-factor determination at an X-ray free-electron laser
title_fullStr Pink-beam serial femtosecond crystallography for accurate structure-factor determination at an X-ray free-electron laser
title_full_unstemmed Pink-beam serial femtosecond crystallography for accurate structure-factor determination at an X-ray free-electron laser
title_short Pink-beam serial femtosecond crystallography for accurate structure-factor determination at an X-ray free-electron laser
title_sort pink beam serial femtosecond crystallography for accurate structure factor determination at an x ray free electron laser
topic pink beams
serial femtosecond crystallography
de novo protein structure determination
single-wavelength anomalous diffraction
xfels
large bandwidths
data-quality indicators
url http://scripts.iucr.org/cgi-bin/paper?S2052252521008046
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