Analysis of structural and chemical inhomogeneity of thin films developed on ferrite grains by color etching with Beraha-I type etchant with spectroscopic ellipsometry and XPS

Analysis of structural and chemical inhomogeneity of thin films developed on ferrite grains by color etching with Beraha-I type etchant with spectroscopic ellipsometry and XPS

The structural and chemical homogeneity of the developed thin film upon color etching a low-carbon steel specimen with Beraha-I type color etchant was investigated by spectroscopic ellipsometry and electron backscatter diffraction examinations. The obtained layer thickness maps showed a good correla...

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Bibliographic Details
Main Authors: József Bálint Renkó, Alekszej Romanenko, Péter János Szabó, Attila Sulyok, Péter Petrik, Attila Bonyár
Format: Article
Language:English
Published: Elsevier 2022-05-01
Series:Journal of Materials Research and Technology
Subjects:
Color etching
Spectroscopic ellipsometry
Grain orientation
Low carbon steel
X-ray photoelectron spectroscopy
Online Access:http://www.sciencedirect.com/science/article/pii/S2238785422004665

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http://www.sciencedirect.com/science/article/pii/S2238785422004665

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