Analysis of structural and chemical inhomogeneity of thin films developed on ferrite grains by color etching with Beraha-I type etchant with spectroscopic ellipsometry and XPS
The structural and chemical homogeneity of the developed thin film upon color etching a low-carbon steel specimen with Beraha-I type color etchant was investigated by spectroscopic ellipsometry and electron backscatter diffraction examinations. The obtained layer thickness maps showed a good correla...
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| Format: | Article |
| Language: | English |
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Elsevier
2022-05-01
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| Series: | Journal of Materials Research and Technology |
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| Online Access: | http://www.sciencedirect.com/science/article/pii/S2238785422004665 |
| _version_ | 1828840259913252864 |
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| author | József Bálint Renkó Alekszej Romanenko Péter János Szabó Attila Sulyok Péter Petrik Attila Bonyár |
| author_facet | József Bálint Renkó Alekszej Romanenko Péter János Szabó Attila Sulyok Péter Petrik Attila Bonyár |
| author_sort | József Bálint Renkó |
| collection | DOAJ |
| description | The structural and chemical homogeneity of the developed thin film upon color etching a low-carbon steel specimen with Beraha-I type color etchant was investigated by spectroscopic ellipsometry and electron backscatter diffraction examinations. The obtained layer thickness maps showed a good correlation with the crystallographic orientation of the individual ferrite grains, corresponding well with previous studies that found a relation between etching and layer build-up speeds and the <100>, <111> directions. However, the refractive index map also showed a dependence on the grain orientation, which contradicts previous models that treat the developed interfering layer as a homogenous material with a constant refractive index and chemical composition. Scanning ellipsometry and X-ray photoelectron spectroscopy measurements confirmed that the chemical composition and refractive index of the developed layer are inhomogeneous both along the surface and the thickness of the film. It was shown that the developed layer consists of mainly oxides and sulfides and that the oxygen content decreases, while the Fe content increases along the normal direction from the surface of the film, in good agreement with the increasing refractive index. The observed differences can be related to the different etching speeds of the ferrite grains (Fe dissolution rate), depending on their orientation. |
| first_indexed | 2024-12-12T19:37:48Z |
| format | Article |
| id | doaj.art-addf578e70844c2d9c480c5c4f2627cd |
| institution | Directory Open Access Journal |
| issn | 2238-7854 |
| language | English |
| last_indexed | 2024-12-12T19:37:48Z |
| publishDate | 2022-05-01 |
| publisher | Elsevier |
| record_format | Article |
| series | Journal of Materials Research and Technology |
| spelling | doaj.art-addf578e70844c2d9c480c5c4f2627cd2022-12-22T00:14:15ZengElsevierJournal of Materials Research and Technology2238-78542022-05-011828222830Analysis of structural and chemical inhomogeneity of thin films developed on ferrite grains by color etching with Beraha-I type etchant with spectroscopic ellipsometry and XPSJózsef Bálint Renkó0Alekszej Romanenko1Péter János Szabó2Attila Sulyok3Péter Petrik4Attila Bonyár5Department of Materials Science and Engineering, Faculty of Mechanical Engineering Budapest University of Technology and Economics, Budapest, HungaryCentre for Energy Research, Institute of Technical Physics and Materials Science (MFA), Budapest, Hungary; Doctoral School of Chemistry, Eötvös Loránd University, Budapest, HungaryDepartment of Materials Science and Engineering, Faculty of Mechanical Engineering Budapest University of Technology and Economics, Budapest, HungaryCentre for Energy Research, Institute of Technical Physics and Materials Science (MFA), Budapest, HungaryCentre for Energy Research, Institute of Technical Physics and Materials Science (MFA), Budapest, HungaryDepartment of Electronics Technology, Faculty of Electrical Engineering and Informatics, Budapest University of Technology and Economics, Budapest, Hungary; Corresponding author.The structural and chemical homogeneity of the developed thin film upon color etching a low-carbon steel specimen with Beraha-I type color etchant was investigated by spectroscopic ellipsometry and electron backscatter diffraction examinations. The obtained layer thickness maps showed a good correlation with the crystallographic orientation of the individual ferrite grains, corresponding well with previous studies that found a relation between etching and layer build-up speeds and the <100>, <111> directions. However, the refractive index map also showed a dependence on the grain orientation, which contradicts previous models that treat the developed interfering layer as a homogenous material with a constant refractive index and chemical composition. Scanning ellipsometry and X-ray photoelectron spectroscopy measurements confirmed that the chemical composition and refractive index of the developed layer are inhomogeneous both along the surface and the thickness of the film. It was shown that the developed layer consists of mainly oxides and sulfides and that the oxygen content decreases, while the Fe content increases along the normal direction from the surface of the film, in good agreement with the increasing refractive index. The observed differences can be related to the different etching speeds of the ferrite grains (Fe dissolution rate), depending on their orientation.http://www.sciencedirect.com/science/article/pii/S2238785422004665Color etchingSpectroscopic ellipsometryGrain orientationLow carbon steelX-ray photoelectron spectroscopy |
| spellingShingle | József Bálint Renkó Alekszej Romanenko Péter János Szabó Attila Sulyok Péter Petrik Attila Bonyár Analysis of structural and chemical inhomogeneity of thin films developed on ferrite grains by color etching with Beraha-I type etchant with spectroscopic ellipsometry and XPS Journal of Materials Research and Technology Color etching Spectroscopic ellipsometry Grain orientation Low carbon steel X-ray photoelectron spectroscopy |
| title | Analysis of structural and chemical inhomogeneity of thin films developed on ferrite grains by color etching with Beraha-I type etchant with spectroscopic ellipsometry and XPS |
| title_full | Analysis of structural and chemical inhomogeneity of thin films developed on ferrite grains by color etching with Beraha-I type etchant with spectroscopic ellipsometry and XPS |
| title_fullStr | Analysis of structural and chemical inhomogeneity of thin films developed on ferrite grains by color etching with Beraha-I type etchant with spectroscopic ellipsometry and XPS |
| title_full_unstemmed | Analysis of structural and chemical inhomogeneity of thin films developed on ferrite grains by color etching with Beraha-I type etchant with spectroscopic ellipsometry and XPS |
| title_short | Analysis of structural and chemical inhomogeneity of thin films developed on ferrite grains by color etching with Beraha-I type etchant with spectroscopic ellipsometry and XPS |
| title_sort | analysis of structural and chemical inhomogeneity of thin films developed on ferrite grains by color etching with beraha i type etchant with spectroscopic ellipsometry and xps |
| topic | Color etching Spectroscopic ellipsometry Grain orientation Low carbon steel X-ray photoelectron spectroscopy |
| url | http://www.sciencedirect.com/science/article/pii/S2238785422004665 |
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