Analysis of structural and chemical inhomogeneity of thin films developed on ferrite grains by color etching with Beraha-I type etchant with spectroscopic ellipsometry and XPS
The structural and chemical homogeneity of the developed thin film upon color etching a low-carbon steel specimen with Beraha-I type color etchant was investigated by spectroscopic ellipsometry and electron backscatter diffraction examinations. The obtained layer thickness maps showed a good correla...
| Main Authors: | , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2022-05-01
|
| Series: | Journal of Materials Research and Technology |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2238785422004665 |