A contribution of X ray diffraction analysis in the determination of creep of Si3N4 ceramics

A contribution of X ray diffraction analysis in the determination of creep of Si3N4 ceramics

The understanding of the creep behavior of silicon nitride (Si3N4) is extremely complex because of a large number of parameters influencing simultaneously the creep deformation of the materials. In general, the main creep mechanisms acting in these materials are grain boundary sliding or materials t...

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Bibliographic Details
Main Authors: Claudinei dos Santos, Kurt Strecker, Francisco Piorino Neto, Olivério Moreira Macedo Silva, Cosme Roberto Moreira da Silva
Format: Article
Language:English
Published: Associação Brasileira de Metalurgia e Materiais (ABM); Associação Brasileira de Cerâmica (ABC); Associação Brasileira de Polímeros (ABPol) 2006-03-01
Series:Materials Research
Subjects:
X ray diffraction
creep mechanisms
Si3N4
Online Access:http://www.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392006000100002

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http://www.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392006000100002

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