Corrigendum: Effect of annealing temperature on structure-property correlations in Zn2SnO4 nanostructured films for optoelectronics (2020 Mater. Res. Express 7 035023)
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2020-01-01
|
| Series: | Materials Research Express |
| Online Access: | https://doi.org/10.1088/2053-1591/ab85c2 |