Single Event Effect Analysis of SiGe Low Noise Amplifier

This paper analyzes the single event transient (SET) response of low noise amplifier (LNA) designed using SiGe heterojunction bipolar transistors (HBT). To verify the radiation tolerance of the proposed LNA, a total of four cascode configurations were designed. Comprehensive mixed-mode simulations w...

Full description

Bibliographic Details
Main Authors: Manel Bouhouche, Saida Latreche
Format: Article
Language:English
Published: University of Banja Luka 2021-12-01
Series:Electronics
Online Access:https://els-journal.net/?page_id=327