Determination of capture barrier energy of the E-center in palladium Schottky barrier diodes of antimony-doped germanium by varying the pulse width
The capture barrier energy of the E-center deep level defect introduced in Pd/Sb-doped Ge by alpha-particle irradiation has been studied. Palladium Schottky barrier diodes (SBDs) fabricated by resistive evaporation technique were successfully characterised by current-voltage ( I-V ), capacitance-vol...
Main Authors: | E Omotoso, A T Paradzah, E Igumbor, B A Taleatu, W E Meyer, F D Auret |
---|---|
Format: | Article |
Language: | English |
Published: |
IOP Publishing
2020-01-01
|
Series: | Materials Research Express |
Subjects: | |
Online Access: | https://doi.org/10.1088/2053-1591/ab6c1c |
Similar Items
-
Study of Radiation-Induced Defects in <i>p</i>-Type Si<sub>1−x</sub>Ge<sub>x</sub> Diodes before and after Annealing
by: Tomas Ceponis, et al.
Published: (2020-12-01) -
The electron and proton irradiation effects on the properties of high-voltage 4H-SiC Schottky diodes within the operating temperature range
by: Kozlovski Vitali, et al.
Published: (2024-03-01) -
5.5 MeV Electron Irradiation-Induced Transformation of Minority Carrier Traps in <i>p</i>-Type Si and Si<sub>1−x</sub>Ge<sub>x</sub> Alloys
by: Jevgenij Pavlov, et al.
Published: (2022-03-01) -
Germanium-based technologies : from materials to devices /
by: Claeys, Cor L., et al.
Published: (2007) -
Thermodynamic Study on Hydrogen Reduction of Germanium Tetrachloride to Germanium
by: Dingfang Cui, et al.
Published: (2024-02-01)