Federated Learning for Condition Monitoring of Industrial Processes: A Review on Fault Diagnosis Methods, Challenges, and Prospects

Condition monitoring (CM) of industrial processes is essential for reducing downtime and increasing productivity through accurate Condition-Based Maintenance (CBM) scheduling. Indeed, advanced intelligent learning systems for Fault Diagnosis (FD) make it possible to effectively isolate and identify...

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Bibliographic Details
Main Authors: Tarek Berghout, Mohamed Benbouzid, Toufik Bentrcia, Wei Hong Lim, Yassine Amirat
Format: Article
Language:English
Published: MDPI AG 2022-12-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/12/1/158