Multi-Level Metric Learning Network for Fine-Grained Classification
The application of fine-grained image classification can be problematic due to subtle differences between classes. The existing global feature-based methods have worse accuracies than regional feature-based methods, because regional feature-based methods focus on the determination of differentiated...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8903259/ |