Multi-Level Metric Learning Network for Fine-Grained Classification
The application of fine-grained image classification can be problematic due to subtle differences between classes. The existing global feature-based methods have worse accuracies than regional feature-based methods, because regional feature-based methods focus on the determination of differentiated...
| Autores principales: | , , , , |
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| Formato: | Artículo |
| Lenguaje: | English |
| Publicado: |
IEEE
2019-01-01
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| Colección: | IEEE Access |
| Materias: | |
| Acceso en línea: | https://ieeexplore.ieee.org/document/8903259/ |