Impact of Low-Variability SOTB Process on Ultra-Low-Voltage Operation of 1 Million Logic Gates
In this study, we demonstrate near-0.1 V minimum operating voltage of a low-variability Silicon on Thin Buried Oxide (SOTB) process for one million logic gates on silicon. Low process variability is required to obtain higher energy efficiency during ultra-low-voltage operation with steeper subthresh...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2015-05-01
|
| Series: | Journal of Low Power Electronics and Applications |
| Subjects: | |
| Online Access: | http://www.mdpi.com/2079-9268/5/2/116 |