Resistor Model of Layered Film Structures

Resistor Model of Layered Film Structures

Electric properties of film structures consisting of two-dimensional layers, composed by nanocrystalline grains of a semiconductor are proposed to be modeled with an equivalent scheme, in which resistors indicate electrical resistance of current channels in metallic contacts, grain material, potenti...

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Bibliographic Details
Main Authors: Tung Pham Van, E. B. Chubenko, V. E. Borisenko
Format: Article
Language:Russian
Published: Educational institution «Belarusian State University of Informatics and Radioelectronics» 2023-04-01
Series:Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
Subjects:
modeling
layered film
equivalent scheme
resistor
potential barrier
carbon nitride
nanocrystal
Online Access:https://doklady.bsuir.by/jour/article/view/3595

Internet

https://doklady.bsuir.by/jour/article/view/3595

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