gm/Id$g_m/I_d$ Analysis of vertical nanowire III–V TFETs

Abstract Experimental data on analog performance of gate‐all‐around III‐V vertical Tunnel Field‐Effect Transistors (TFETs) and circuits are presented. The individual device shows a minimal subthreshold swing of 44 mV/dec and transconductance efficiency of 50 V−1 for current range of 9 nA/μm to 100 n...

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Bibliographic Details
Main Authors: Gautham Rangasamy, Zhongyunshen Zhu, Lars Ohlsson Fhager, Lars‐Erik Wernersson
Format: Article
Language:English
Published: Wiley 2023-09-01
Series:Electronics Letters
Subjects:
Online Access:https://doi.org/10.1049/ell2.12954