Structure Function Analysis of Temperature-Dependent Thermal Properties of Nm-Thin Nb<sub>2</sub>O<sub>5</sub>

A 166-nm-thick amorphous Niobium pentoxide layer (Nb<sub>2</sub>O<sub>5</sub>) on a silicon substrate was investigated by using time domain thermoreflectance at ambient temperatures from 25 &#176;C to 500 &#176;C. In the time domain thermoreflectance measurements, the...

Full description

Bibliographic Details
Main Authors: Lisa Mitterhuber, Elke Kraker, Stefan Defregger
Format: Article
Language:English
Published: MDPI AG 2019-02-01
Series:Energies
Subjects:
Online Access:https://www.mdpi.com/1996-1073/12/4/610