Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron Laser

Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron Laser

X-ray absorption spectroscopy (XAS) and the directly linked X-ray reflectivity near absorption edges yield a wealth of specific information on the electronic structure around the resonantly addressed element. Observing the dynamic response of complex materials to optical excitations in pump–probe ex...

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Bibliographic Details
Main Authors: Robin Y. Engel, Piter S. Miedema, Diego Turenne, Igor Vaskivskyi, Günter Brenner, Siarhei Dziarzhytski, Marion Kuhlmann, Jan O. Schunck, Florian Döring, Andriy Styervoyedov, Stuart S.P. Parkin, Christian David, Christian Schüßler-Langeheine, Hermann A. Dürr, Martin Beye
Format: Article
Language:English
Published: MDPI AG 2020-10-01
Series:Applied Sciences
Subjects:
X-ray absorption spectroscopy
free electron laser
intensity normalization
transmission grating
X-ray reflectivity
Online Access:https://www.mdpi.com/2076-3417/10/19/6947

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https://www.mdpi.com/2076-3417/10/19/6947

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