Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron Laser
X-ray absorption spectroscopy (XAS) and the directly linked X-ray reflectivity near absorption edges yield a wealth of specific information on the electronic structure around the resonantly addressed element. Observing the dynamic response of complex materials to optical excitations in pump–probe ex...
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2020-10-01
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author | Robin Y. Engel Piter S. Miedema Diego Turenne Igor Vaskivskyi Günter Brenner Siarhei Dziarzhytski Marion Kuhlmann Jan O. Schunck Florian Döring Andriy Styervoyedov Stuart S.P. Parkin Christian David Christian Schüßler-Langeheine Hermann A. Dürr Martin Beye |
author_facet | Robin Y. Engel Piter S. Miedema Diego Turenne Igor Vaskivskyi Günter Brenner Siarhei Dziarzhytski Marion Kuhlmann Jan O. Schunck Florian Döring Andriy Styervoyedov Stuart S.P. Parkin Christian David Christian Schüßler-Langeheine Hermann A. Dürr Martin Beye |
author_sort | Robin Y. Engel |
collection | DOAJ |
description | X-ray absorption spectroscopy (XAS) and the directly linked X-ray reflectivity near absorption edges yield a wealth of specific information on the electronic structure around the resonantly addressed element. Observing the dynamic response of complex materials to optical excitations in pump–probe experiments requires high sensitivity to small changes in the spectra which in turn necessitates the brilliance of free electron laser (FEL) pulses. However, due to the fluctuating spectral content of pulses generated by self-amplified spontaneous emission (SASE), FEL experiments often struggle to reach the full sensitivity and time-resolution that FELs can in principle enable. Here, we implement a setup which solves two common challenges in this type of spectroscopy using FELs: First, we achieve a high spectral resolution by using a spectrometer downstream of the sample instead of a monochromator upstream of the sample. Thus, the full FEL bandwidth contributes to the measurement at the same time, and the FEL pulse duration is not elongated by a monochromator. Second, the FEL beam is divided into identical copies by a transmission grating beam splitter so that two spectra from separate spots on the sample (or from the sample and known reference) can be recorded in-parallel with the same spectrometer, enabling a spectrally resolved intensity normalization of pulse fluctuations in pump–probe scenarios. We analyze the capabilities of this setup around the oxygen <i>K-</i> and nickel <i>L-</i>edges recorded with third harmonic radiation of the free electron laser in Hamburg (FLASH), demonstrating the capability for pump–probe measurements with sensitivity to reflectivity changes on the per mill level. |
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language | English |
last_indexed | 2024-03-10T15:50:57Z |
publishDate | 2020-10-01 |
publisher | MDPI AG |
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spelling | doaj.art-b108007393af4586a73f86b1e248874c2023-11-20T16:03:17ZengMDPI AGApplied Sciences2076-34172020-10-011019694710.3390/app10196947Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron LaserRobin Y. Engel0Piter S. Miedema1Diego Turenne2Igor Vaskivskyi3Günter Brenner4Siarhei Dziarzhytski5Marion Kuhlmann6Jan O. Schunck7Florian Döring8Andriy Styervoyedov9Stuart S.P. Parkin10Christian David11Christian Schüßler-Langeheine12Hermann A. Dürr13Martin Beye14Deutsches Elektronen Synchrotron, 22607 Hamburg, GermanyDeutsches Elektronen Synchrotron, 22607 Hamburg, GermanyDepartment of Physics and Astronomy, Uppsala University, S-75120 Uppsala, SwedenDepartment of Physics and Astronomy, Uppsala University, S-75120 Uppsala, SwedenDeutsches Elektronen Synchrotron, 22607 Hamburg, GermanyDeutsches Elektronen Synchrotron, 22607 Hamburg, GermanyDeutsches Elektronen Synchrotron, 22607 Hamburg, GermanyDeutsches Elektronen Synchrotron, 22607 Hamburg, GermanyPaul Scherrer Institut, 5232 Villigen-PSI, SwitzerlandMax-Planck Institut für Mikrostrukturphysik, Weinberg 2, 06108-06132 Halle, GermanyMax-Planck Institut für Mikrostrukturphysik, Weinberg 2, 06108-06132 Halle, GermanyPaul Scherrer Institut, 5232 Villigen-PSI, SwitzerlandHelmholtz-Zentrum Berlin für Materialien und Energie GmbH, 12489 Berlin, GermanyDepartment of Physics and Astronomy, Uppsala University, S-75120 Uppsala, SwedenDeutsches Elektronen Synchrotron, 22607 Hamburg, GermanyX-ray absorption spectroscopy (XAS) and the directly linked X-ray reflectivity near absorption edges yield a wealth of specific information on the electronic structure around the resonantly addressed element. Observing the dynamic response of complex materials to optical excitations in pump–probe experiments requires high sensitivity to small changes in the spectra which in turn necessitates the brilliance of free electron laser (FEL) pulses. However, due to the fluctuating spectral content of pulses generated by self-amplified spontaneous emission (SASE), FEL experiments often struggle to reach the full sensitivity and time-resolution that FELs can in principle enable. Here, we implement a setup which solves two common challenges in this type of spectroscopy using FELs: First, we achieve a high spectral resolution by using a spectrometer downstream of the sample instead of a monochromator upstream of the sample. Thus, the full FEL bandwidth contributes to the measurement at the same time, and the FEL pulse duration is not elongated by a monochromator. Second, the FEL beam is divided into identical copies by a transmission grating beam splitter so that two spectra from separate spots on the sample (or from the sample and known reference) can be recorded in-parallel with the same spectrometer, enabling a spectrally resolved intensity normalization of pulse fluctuations in pump–probe scenarios. We analyze the capabilities of this setup around the oxygen <i>K-</i> and nickel <i>L-</i>edges recorded with third harmonic radiation of the free electron laser in Hamburg (FLASH), demonstrating the capability for pump–probe measurements with sensitivity to reflectivity changes on the per mill level.https://www.mdpi.com/2076-3417/10/19/6947X-ray absorption spectroscopyfree electron laserintensity normalizationtransmission gratingX-ray reflectivity |
spellingShingle | Robin Y. Engel Piter S. Miedema Diego Turenne Igor Vaskivskyi Günter Brenner Siarhei Dziarzhytski Marion Kuhlmann Jan O. Schunck Florian Döring Andriy Styervoyedov Stuart S.P. Parkin Christian David Christian Schüßler-Langeheine Hermann A. Dürr Martin Beye Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron Laser Applied Sciences X-ray absorption spectroscopy free electron laser intensity normalization transmission grating X-ray reflectivity |
title | Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron Laser |
title_full | Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron Laser |
title_fullStr | Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron Laser |
title_full_unstemmed | Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron Laser |
title_short | Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron Laser |
title_sort | parallel broadband femtosecond reflection spectroscopy at a soft x ray free electron laser |
topic | X-ray absorption spectroscopy free electron laser intensity normalization transmission grating X-ray reflectivity |
url | https://www.mdpi.com/2076-3417/10/19/6947 |
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