Entropy variations and light ray operators from replica defects

Abstract We study the defect operator product expansion (OPE) of displacement operators in free and interacting conformal field theories using replica methods. We show that as n approaches 1 a contact term can emerge when the OPE contains defect operators of twist d − 2. For interacting theories and...

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Bibliographic Details
Main Authors: Srivatsan Balakrishnan, Venkatesa Chandrasekaran, Thomas Faulkner, Adam Levine, Arvin Shahbazi-Moghaddam
Format: Article
Language:English
Published: SpringerOpen 2022-09-01
Series:Journal of High Energy Physics
Subjects:
Online Access:https://doi.org/10.1007/JHEP09(2022)217