Entropy variations and light ray operators from replica defects

Abstract We study the defect operator product expansion (OPE) of displacement operators in free and interacting conformal field theories using replica methods. We show that as n approaches 1 a contact term can emerge when the OPE contains defect operators of twist d − 2. For interacting theories and...

Полное описание

Библиографические подробности
Главные авторы: Srivatsan Balakrishnan, Venkatesa Chandrasekaran, Thomas Faulkner, Adam Levine, Arvin Shahbazi-Moghaddam
Формат: Статья
Язык:English
Опубликовано: SpringerOpen 2022-09-01
Серии:Journal of High Energy Physics
Предметы:
Online-ссылка:https://doi.org/10.1007/JHEP09(2022)217