Effect of Annealing and Thickness of Co<sub>40</sub>Fe<sub>40</sub>Yb<sub>20</sub> Thin Films on Various Physical Properties on a Glass Substrate

Effect of Annealing and Thickness of Co<sub>40</sub>Fe<sub>40</sub>Yb<sub>20</sub> Thin Films on Various Physical Properties on a Glass Substrate

The aim of this work is to investigate the effect of annealing and thickness on various physical properties in Co<sub>40</sub>Fe<sub>40</sub>Yb<sub>20</sub> thin films. X-ray diffraction (XRD) was used to determine the amorphous structure of Co<sub>40</su...

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Bibliographic Details
Main Authors: Wen-Jen Liu, Yung-Huang Chang, Chia-Chin Chiang, Chi-Lon Fern, Yuan-Tsung Chen, Ying-Hsuan Chen, Hao-Wen Liao, Te-Ho Wu, Shih-Hung Lin, Ko-Wei Lin, Po-Wei Chi
Format: Article
Language:English
Published: MDPI AG 2022-11-01
Series:Materials
Subjects:
X-ray diffraction (XRD)
adhesion
transmittance
electrical properties
nanomechanical property
low-frequency alternating current magnetic susceptibility (χ<sub>ac</sub>)
Online Access:https://www.mdpi.com/1996-1944/15/23/8509

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https://www.mdpi.com/1996-1944/15/23/8509

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