Surface and Microstructure Analysis of CoCrPt Film on RuCoCrX (X = Ti, Re) Intermediate Layers

The microstructural and magnetic properties of perpendicular anisotropic CoCrPt films deposited on Ru or RuCoCrX (X = Ti, Re) intermediate layers were studied. The <i>c</i>-axis of CoCrPt grains were promoted by (0002) textured RuCoCr, and RuCoCrX (X = Ti, Re) intermediate layers due to...

Full description

Bibliographic Details
Main Authors: Jai-Lin Tsai, Jyun-You Chen, Cheng Dai, Ting-Wei Hsu, Shi-Min Weng
Format: Article
Language:English
Published: MDPI AG 2020-04-01
Series:Crystals
Subjects:
Online Access:https://www.mdpi.com/2073-4352/10/4/263