Design of Novel and Low Cost Triple-node Upset Self-recoverable Latch
With the development of semiconductor technology, the size of transistors continues to shrink. In complex radiation environments in aerospace and other fields, small-sized circuits are more prone to soft error (SE). Currently, single-node upset (SNU), double-node upset (DNU) and triple-node upset (T...
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| Format: | Article |
| Language: | English |
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Editorial Board of Atomic Energy Science and Technology
2023-12-01
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| Series: | Yuanzineng kexue jishu |
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