Effect of thickness on the structure, morphology and A.C conductivity of Bi2S3 thin films
Thin films samples of Bismuth sulfide Bi2S3 had deposited on glass substrate using thermal evaporation method by chemical method under vacuum of 10-5 Toor. XRD and AFM were used to check the structure and morphology of the Bi2S3 thin films. The results showed that the films with law thickness <7...
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| Format: | Article |
| Language: | English |
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University of Baghdad
2019-01-01
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| Series: | Iraqi Journal of Physics |
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| Online Access: | https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/144 |