Study on Creepage Control for PLS-160 Wheel–Rail Adhesion Test Rig Based on LADRC

Study on Creepage Control for PLS-160 Wheel–Rail Adhesion Test Rig Based on LADRC

Aiming at the problem of low control accuracy caused by nonlinear disturbances in the operation of the PLS-160 wheel–rail adhesion test rig, a linear active disturbance rejection controller (LADRC) suitable for the wheel–rail adhesion test rig was designed. The influence of nonlinear disturbances du...

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Bibliographic Details
Main Authors: Chun Tian, Gengwei Zhai, Yingqi Gao, Chao Chen, Jiajun Zhou
Format: Article
Language:English
Published: MDPI AG 2023-02-01
Series:Sensors
Subjects:
PLS-160 wheel–rail adhesion test rig
nonlinear disturbance
linear active disturbance rejection controller
co-simulation
creepage control
Online Access:https://www.mdpi.com/1424-8220/23/4/1792

Internet

https://www.mdpi.com/1424-8220/23/4/1792

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