Focus image scanning microscopy for sharp and gentle super-resolved microscopy

Focus image scanning microscopy for sharp and gentle super-resolved microscopy

Super-resolution microscopy techniques can be challenging for live cells and thick samples. Here, the authors propose a method to reduce beam intensity and remove out-of-focus fluorescence background in image-scanning microscopy (ISM) and its combination with stimulated emission depletion (STED).

Bibliographic Details
Main Authors: Giorgio Tortarolo, Alessandro Zunino, Francesco Fersini, Marco Castello, Simonluca Piazza, Colin J. R. Sheppard, Paolo Bianchini, Alberto Diaspro, Sami Koho, Giuseppe Vicidomini
Format: Article
Language:English
Published: Nature Portfolio 2022-12-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-022-35333-y

Internet

https://doi.org/10.1038/s41467-022-35333-y

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