Focus image scanning microscopy for sharp and gentle super-resolved microscopy

Super-resolution microscopy techniques can be challenging for live cells and thick samples. Here, the authors propose a method to reduce beam intensity and remove out-of-focus fluorescence background in image-scanning microscopy (ISM) and its combination with stimulated emission depletion (STED).

Bibliographic Details
Main Authors: Giorgio Tortarolo, Alessandro Zunino, Francesco Fersini, Marco Castello, Simonluca Piazza, Colin J. R. Sheppard, Paolo Bianchini, Alberto Diaspro, Sami Koho, Giuseppe Vicidomini
Format: Article
Language:English
Published: Nature Portfolio 2022-12-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-022-35333-y
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author Giorgio Tortarolo
Alessandro Zunino
Francesco Fersini
Marco Castello
Simonluca Piazza
Colin J. R. Sheppard
Paolo Bianchini
Alberto Diaspro
Sami Koho
Giuseppe Vicidomini
author_facet Giorgio Tortarolo
Alessandro Zunino
Francesco Fersini
Marco Castello
Simonluca Piazza
Colin J. R. Sheppard
Paolo Bianchini
Alberto Diaspro
Sami Koho
Giuseppe Vicidomini
author_sort Giorgio Tortarolo
collection DOAJ
description Super-resolution microscopy techniques can be challenging for live cells and thick samples. Here, the authors propose a method to reduce beam intensity and remove out-of-focus fluorescence background in image-scanning microscopy (ISM) and its combination with stimulated emission depletion (STED).
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spelling doaj.art-b3f52a050bed4a879c1cfb1ec738f0b62022-12-22T03:54:24ZengNature PortfolioNature Communications2041-17232022-12-0113111410.1038/s41467-022-35333-yFocus image scanning microscopy for sharp and gentle super-resolved microscopyGiorgio Tortarolo0Alessandro Zunino1Francesco Fersini2Marco Castello3Simonluca Piazza4Colin J. R. Sheppard5Paolo Bianchini6Alberto Diaspro7Sami Koho8Giuseppe Vicidomini9Molecular Microscopy and Spectroscopy, Istituto Italiano di TecnologiaMolecular Microscopy and Spectroscopy, Istituto Italiano di TecnologiaMolecular Microscopy and Spectroscopy, Istituto Italiano di TecnologiaMolecular Microscopy and Spectroscopy, Istituto Italiano di TecnologiaMolecular Microscopy and Spectroscopy, Istituto Italiano di TecnologiaNanoscopy & NIC@IIT, Istituto Italiano di TecnologiaNanoscopy & NIC@IIT, Istituto Italiano di TecnologiaNanoscopy & NIC@IIT, Istituto Italiano di TecnologiaMolecular Microscopy and Spectroscopy, Istituto Italiano di TecnologiaMolecular Microscopy and Spectroscopy, Istituto Italiano di TecnologiaSuper-resolution microscopy techniques can be challenging for live cells and thick samples. Here, the authors propose a method to reduce beam intensity and remove out-of-focus fluorescence background in image-scanning microscopy (ISM) and its combination with stimulated emission depletion (STED).https://doi.org/10.1038/s41467-022-35333-y
spellingShingle Giorgio Tortarolo
Alessandro Zunino
Francesco Fersini
Marco Castello
Simonluca Piazza
Colin J. R. Sheppard
Paolo Bianchini
Alberto Diaspro
Sami Koho
Giuseppe Vicidomini
Focus image scanning microscopy for sharp and gentle super-resolved microscopy
Nature Communications
title Focus image scanning microscopy for sharp and gentle super-resolved microscopy
title_full Focus image scanning microscopy for sharp and gentle super-resolved microscopy
title_fullStr Focus image scanning microscopy for sharp and gentle super-resolved microscopy
title_full_unstemmed Focus image scanning microscopy for sharp and gentle super-resolved microscopy
title_short Focus image scanning microscopy for sharp and gentle super-resolved microscopy
title_sort focus image scanning microscopy for sharp and gentle super resolved microscopy
url https://doi.org/10.1038/s41467-022-35333-y
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