Focus image scanning microscopy for sharp and gentle super-resolved microscopy
Super-resolution microscopy techniques can be challenging for live cells and thick samples. Here, the authors propose a method to reduce beam intensity and remove out-of-focus fluorescence background in image-scanning microscopy (ISM) and its combination with stimulated emission depletion (STED).
Main Authors: | , , , , , , , , , |
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Format: | Article |
Language: | English |
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Nature Portfolio
2022-12-01
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Series: | Nature Communications |
Online Access: | https://doi.org/10.1038/s41467-022-35333-y |
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author | Giorgio Tortarolo Alessandro Zunino Francesco Fersini Marco Castello Simonluca Piazza Colin J. R. Sheppard Paolo Bianchini Alberto Diaspro Sami Koho Giuseppe Vicidomini |
author_facet | Giorgio Tortarolo Alessandro Zunino Francesco Fersini Marco Castello Simonluca Piazza Colin J. R. Sheppard Paolo Bianchini Alberto Diaspro Sami Koho Giuseppe Vicidomini |
author_sort | Giorgio Tortarolo |
collection | DOAJ |
description | Super-resolution microscopy techniques can be challenging for live cells and thick samples. Here, the authors propose a method to reduce beam intensity and remove out-of-focus fluorescence background in image-scanning microscopy (ISM) and its combination with stimulated emission depletion (STED). |
first_indexed | 2024-04-12T01:02:38Z |
format | Article |
id | doaj.art-b3f52a050bed4a879c1cfb1ec738f0b6 |
institution | Directory Open Access Journal |
issn | 2041-1723 |
language | English |
last_indexed | 2024-04-12T01:02:38Z |
publishDate | 2022-12-01 |
publisher | Nature Portfolio |
record_format | Article |
series | Nature Communications |
spelling | doaj.art-b3f52a050bed4a879c1cfb1ec738f0b62022-12-22T03:54:24ZengNature PortfolioNature Communications2041-17232022-12-0113111410.1038/s41467-022-35333-yFocus image scanning microscopy for sharp and gentle super-resolved microscopyGiorgio Tortarolo0Alessandro Zunino1Francesco Fersini2Marco Castello3Simonluca Piazza4Colin J. R. Sheppard5Paolo Bianchini6Alberto Diaspro7Sami Koho8Giuseppe Vicidomini9Molecular Microscopy and Spectroscopy, Istituto Italiano di TecnologiaMolecular Microscopy and Spectroscopy, Istituto Italiano di TecnologiaMolecular Microscopy and Spectroscopy, Istituto Italiano di TecnologiaMolecular Microscopy and Spectroscopy, Istituto Italiano di TecnologiaMolecular Microscopy and Spectroscopy, Istituto Italiano di TecnologiaNanoscopy & NIC@IIT, Istituto Italiano di TecnologiaNanoscopy & NIC@IIT, Istituto Italiano di TecnologiaNanoscopy & NIC@IIT, Istituto Italiano di TecnologiaMolecular Microscopy and Spectroscopy, Istituto Italiano di TecnologiaMolecular Microscopy and Spectroscopy, Istituto Italiano di TecnologiaSuper-resolution microscopy techniques can be challenging for live cells and thick samples. Here, the authors propose a method to reduce beam intensity and remove out-of-focus fluorescence background in image-scanning microscopy (ISM) and its combination with stimulated emission depletion (STED).https://doi.org/10.1038/s41467-022-35333-y |
spellingShingle | Giorgio Tortarolo Alessandro Zunino Francesco Fersini Marco Castello Simonluca Piazza Colin J. R. Sheppard Paolo Bianchini Alberto Diaspro Sami Koho Giuseppe Vicidomini Focus image scanning microscopy for sharp and gentle super-resolved microscopy Nature Communications |
title | Focus image scanning microscopy for sharp and gentle super-resolved microscopy |
title_full | Focus image scanning microscopy for sharp and gentle super-resolved microscopy |
title_fullStr | Focus image scanning microscopy for sharp and gentle super-resolved microscopy |
title_full_unstemmed | Focus image scanning microscopy for sharp and gentle super-resolved microscopy |
title_short | Focus image scanning microscopy for sharp and gentle super-resolved microscopy |
title_sort | focus image scanning microscopy for sharp and gentle super resolved microscopy |
url | https://doi.org/10.1038/s41467-022-35333-y |
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