Random Positional Deviations Correction for Each LED via ePIE in Fourier Ptychographic Microscopy

Random Positional Deviations Correction for Each LED via ePIE in Fourier Ptychographic Microscopy

Fourier ptychography microscopy (FPM) is a lately developed technique, which achieves wide field, high resolution, and phase imaging, simultaneously. FPM stitches together the captured low-resolution images corresponding to angular varying illuminations in Fourier domain utilizing the concept of syn...

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Bibliographic Details
Main Authors: Sining Chen, Tingfa Xu, Jizhou Zhang, Xing Wang, Yizhou Zhang
Format: Article
Language:English
Published: IEEE 2018-01-01
Series:IEEE Access
Subjects:
Computational imaging
imaging system
microscopy
phase retrieval
Online Access:https://ieeexplore.ieee.org/document/8388196/

Internet

https://ieeexplore.ieee.org/document/8388196/

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