Nanoparticle Recognition on Scanning Probe Microscopy Images Using Computer Vision and Deep Learning
Identifying, counting and measuring particles is an important component of many research studies. Images with particles are usually processed by hand using a software ruler. Automated processing, based on conventional image processing methods (edge detection, segmentation, etc.) are not universal, c...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-06-01
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| Series: | Nanomaterials |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-4991/10/7/1285 |