Rapid thermal annealing for high-quality ITO thin films deposited by radio-frequency magnetron sputtering

In this work, rapid thermal annealing (RTA) was applied to indium tin oxide (ITO) films in ambient atmosphere, resulting in significant improvements of the quality of the ITO films that are commonly used as conductive transparent electrodes for photovoltaic structures. Starting from a single sintere...

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Bibliographic Details
Main Authors: Petronela Prepelita, Ionel Stavarache, Doina Craciun, Florin Garoi, Catalin Negrila, Beatrice Gabriela Sbarcea, Valentin Craciun
Format: Article
Language:English
Published: Beilstein-Institut 2019-07-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Online Access:https://doi.org/10.3762/bjnano.10.149