Recent Progress in the Correlative Structured Illumination Microscopy

Recent Progress in the Correlative Structured Illumination Microscopy

The super-resolution imaging technique of structured illumination microscopy (SIM) enables the mixing of high-frequency information into the optical transmission domain via light-source modulation, thus breaking the optical diffraction limit. Correlative SIM, which combines other techniques with SIM...

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Bibliographic Details
Main Authors: Meiting Wang, Jiajie Chen, Lei Wang, Xiaomin Zheng, Jie Zhou, Youjun Zeng, Junle Qu, Yonghong Shao, Bruce Zhi Gao
Format: Article
Language:English
Published: MDPI AG 2021-12-01
Series:Chemosensors
Subjects:
diffraction limit
super-resolution imaging
structured illumination microscopy
correlative microscopy
Online Access:https://www.mdpi.com/2227-9040/9/12/364

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https://www.mdpi.com/2227-9040/9/12/364

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