The effects of defects on the defect formation energy, electronic band structure, and electron mobility in 4H–SiC

The effects of defects on the defect formation energy, electronic band structure, and electron mobility in 4H–SiC

With the first-principle method, we studied the effects of the type and position of defects on the defect formation energy, electronic band structure, and electron mobility of the 4-layer hexagonal system silicon carbon (4H–SiC). The vacancy defect formation energy is smaller than the interstitial d...

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Bibliographic Details
Main Authors: Shangting Jiang, Ye Li, Zhiyong Chen, Weihua Zhu, Qinmao Wu, Hongyu He, Xinlin Wang
Format: Article
Language:English
Published: AIP Publishing LLC 2022-06-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0095061

Internet

http://dx.doi.org/10.1063/5.0095061

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