Combination of focused ion beam (FIB) and microtome by ultrathin slice preparation for transmission electron microscopy (TEM) observation

Combination of focused ion beam (FIB) and microtome by ultrathin slice preparation for transmission electron microscopy (TEM) observation

Abstract There are growing demands for integrated study of isotopes, trace elements and crystallography of micron-sized grains observed on polished sections or scattered on surface of sample holders. However, transmission electron microscopy (TEM) observation is largely restricted by the challenges...

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Bibliographic Details
Main Authors: Yuchen Xu, Lixin Gu, Yang Li, Bing Mo, Yangting Lin
Format: Article
Language:English
Published: SpringerOpen 2018-09-01
Series:Earth, Planets and Space
Subjects:
Focused ion beam
Transmission electron microscopy
Microtome
Presolar grains
Graphite
Online Access:http://link.springer.com/article/10.1186/s40623-018-0920-7

Internet

http://link.springer.com/article/10.1186/s40623-018-0920-7

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