Investigation of CVD graphene as-grown on Cu foil using simultaneous scanning tunneling/atomic force microscopy
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) images of graphene reveal either a triangular or honeycomb pattern at the atomic scale depending on the imaging parameters. The triangular patterns at the atomic scale are particularly difficult to interpret, as the maxima in the...
| Päätekijät: | , , , |
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| Aineistotyyppi: | Artikkeli |
| Kieli: | English |
| Julkaistu: |
Beilstein-Institut
2018-11-01
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| Sarja: | Beilstein Journal of Nanotechnology |
| Aiheet: | |
| Linkit: | https://doi.org/10.3762/bjnano.9.274 |