Investigation of CVD graphene as-grown on Cu foil using simultaneous scanning tunneling/atomic force microscopy
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) images of graphene reveal either a triangular or honeycomb pattern at the atomic scale depending on the imaging parameters. The triangular patterns at the atomic scale are particularly difficult to interpret, as the maxima in the...
Main Authors: | Majid Fazeli Jadidi, Umut Kamber, Oğuzhan Gürlü, H. Özgür Özer |
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Format: | Article |
Language: | English |
Published: |
Beilstein-Institut
2018-11-01
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Series: | Beilstein Journal of Nanotechnology |
Subjects: | |
Online Access: | https://doi.org/10.3762/bjnano.9.274 |
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