An Analytical Method for Modelling Pull-In Effect during Anodic Bonding

Pull-in effect is a common phenomenon during anodic bonding, a key step in the<br />fabrication processes of capacitive sensors and actuators. To assist the designs and fabrications of<br />these transducers, this paper presents an analytical method for modelling the pull-in effect durin...

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Main Authors: Qiuxu Wei, Bo Xie, Yulan Lu, Deyong Chen, Jian Chen, Junbo Wang
Format: Article
Language:English
Published: MDPI AG 2018-12-01
Series:Proceedings
Subjects:
Online Access:https://www.mdpi.com/2504-3900/2/13/969
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author Qiuxu Wei
Bo Xie
Yulan Lu
Deyong Chen
Jian Chen
Junbo Wang
author_facet Qiuxu Wei
Bo Xie
Yulan Lu
Deyong Chen
Jian Chen
Junbo Wang
author_sort Qiuxu Wei
collection DOAJ
description Pull-in effect is a common phenomenon during anodic bonding, a key step in the<br />fabrication processes of capacitive sensors and actuators. To assist the designs and fabrications of<br />these transducers, this paper presents an analytical method for modelling the pull-in effect during<br />anodic bonding. The pull-in effect model was verified by finite element analysis and a verification<br />experiment respectively. The verification results indicate that the analytical method for modelling<br />the pull-in effect during anodic bonding is capable for predicting pull-in voltages of anodically<br />bonded capacitive sensors and actuators in a universal and practical manner without any additional<br />fabrication process.
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spelling doaj.art-b5d02af5977b474eb5a93c148182949c2024-10-02T16:08:57ZengMDPI AGProceedings2504-39002018-12-0121396910.3390/proceedings2130969proceedings2130969An Analytical Method for Modelling Pull-In Effect during Anodic BondingQiuxu Wei0Bo Xie1Yulan Lu2Deyong Chen3Jian Chen4Junbo Wang5Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, ChinaInstitute of Electronics, Chinese Academy of Sciences, Beijing 100190, ChinaInstitute of Electronics, Chinese Academy of Sciences, Beijing 100190, ChinaInstitute of Electronics, Chinese Academy of Sciences, Beijing 100190, ChinaInstitute of Electronics, Chinese Academy of Sciences, Beijing 100190, ChinaInstitute of Electronics, Chinese Academy of Sciences, Beijing 100190, ChinaPull-in effect is a common phenomenon during anodic bonding, a key step in the<br />fabrication processes of capacitive sensors and actuators. To assist the designs and fabrications of<br />these transducers, this paper presents an analytical method for modelling the pull-in effect during<br />anodic bonding. The pull-in effect model was verified by finite element analysis and a verification<br />experiment respectively. The verification results indicate that the analytical method for modelling<br />the pull-in effect during anodic bonding is capable for predicting pull-in voltages of anodically<br />bonded capacitive sensors and actuators in a universal and practical manner without any additional<br />fabrication process.https://www.mdpi.com/2504-3900/2/13/969pull-in effectanodic bondingcapacitive transducer
spellingShingle Qiuxu Wei
Bo Xie
Yulan Lu
Deyong Chen
Jian Chen
Junbo Wang
An Analytical Method for Modelling Pull-In Effect during Anodic Bonding
Proceedings
pull-in effect
anodic bonding
capacitive transducer
title An Analytical Method for Modelling Pull-In Effect during Anodic Bonding
title_full An Analytical Method for Modelling Pull-In Effect during Anodic Bonding
title_fullStr An Analytical Method for Modelling Pull-In Effect during Anodic Bonding
title_full_unstemmed An Analytical Method for Modelling Pull-In Effect during Anodic Bonding
title_short An Analytical Method for Modelling Pull-In Effect during Anodic Bonding
title_sort analytical method for modelling pull in effect during anodic bonding
topic pull-in effect
anodic bonding
capacitive transducer
url https://www.mdpi.com/2504-3900/2/13/969
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